Dipole antenna factor calibration is avilable with the Japan Calibration Service System (JCSS; http://www.jcsslabo.or.jp/index_e.htm , http://www.nite.go.jp/asse/jcss/en/index.html ) at 24 frequencies in the range from 30 to 1000 MHz. Since dipole antennas [1] are mainly used for the evaluation of the test-site quality in this frequency range, the antenna shoul be calibrated correctly. In our institute the dipole antenna is holizontally located at 2.0 m above the ground plane. The electric field strength at a location can be easily estimated by multiplying the indicated voltage on the receiver display and the calibrated AF in the emission measurement. Thus, it is useful to measure the field strength. The primary standard of the diple antenna that containis 24 elements for the 24 calibration frequencies are calibrated by the three-antenna method on our open-area test site. The element length is approximitly half-wavelength at each frequency. The secondary standard dipole antennas of the acredited calibration laboratories are calibrated by the reference antenna method by replacing the primary standard antenna with the userfs antenna.
The antenna factor (AF) is defined as the
ratio of the incident electric field strength
to the induced voltage
across the terminal impedance and given by;
(1/m)     (1)
Here it is assumed that the
antenna is located to obtain the maximum output response to the incident field.
We should note that the terminal impedance of the ordinary receivers is adjusted
to be 50 ¶ (refer to Fig. 1). Advantage to use the AF is that the field
strength
can be easily estimated by multiplying the calibrated AF to the measured
.
Since many EMC measurements are carried out on an open-area test site, the AF is calibrated above a large ground plane with a sufficient obstruction free area [2]. However, the AF changes with respect to the antenna height and polarization due to the mutual coupling between the antenna element and its image. To avoid this problem the antenna under calibration is located horizontally at a height of 2.0 m above the ground plane in our calibration procedure [3]. By locating both of the transmitting and receiving antennas at a height above the ground plane the direct electromagnetic fields may be significantly reduced by the fields reflected by the ground plane. This will impact uncertainty of the calibration. Thus, the separation between antennas is appropriately determined in advance by the calculation to avoid the degraded calibration. Three antennas will be simultaneously calibrated by the three-antenna method (TAM) and the associated uncertainty for the three calibrated antennas must be the same. One of the antenna is specified as the standard dipole antenna and the secondary standard antenna of the accredited laboratories is calibrated by the reference antenna method (RAM). Figure 3 shows the schematic diagram of the calibration.
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| Fig. 2 AIST open-area test site | Fig. 3 Schematic diagram of the calibration. |
The TAM is widely used to obtain AFs. Three antennas are necessary for this method. The
site attenuations between three antenna pairs
are measured. Then the AF of an antenna
is given by;
     (2)
     (3)
where
and
are the direct and reflected path lengths between antennas, respectively.
Note the subscript
is introduced to specify the antenna pair.
AFs of a user's antenna are calibrated by the RAM. The AF of the user's dipole is
given by the ratio of the measured site attenuation
the transmitting antenna and the standard antenna (whose AF is
)
to the one
between transmitting antenna and the user's antenna (whose AF is
). Let's assume the measurement system is ideal then we
obtain;
.     (4)
The AF of a dipole antenna is calibrated at 2.0 m above a large flat conducting plane by locating antenna element horizontally. Calibration is carried out at following 24 frequencies.
Frequencies: 30, 35, 40, 45, 50, 60, 70, 80, 90, 100, 120, 140, 160, 180, 200, 250, 300, 400, 500, 600, 700, 800, 900, 1000 MHz
0.7 dB (k=2)
Figure 4 shows an example of the calibrated AF of a dipole antenna and the associated uncertainties. Fig. 4 (2) contains uncertainties associated both with the TAM and the RAM [6].
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| (1) Calibrated AF at 24 frequencies. | (2) Uncertainties associated with the AF calibration. |
Contact information:Copyright (C) 2004-2005 All Rights Reserved.
Electromagnetic fields section,
Electromagnetic waves division,
National Metrology Institute of Japan
National Institute of Advanced Industrial Sciense and Technology
Room 317, Tsukuba central 3
1-1-1, Umezono, Tsukuba 305-8563 Japan
Tel: +81-29-861-4177, Fax: +81-29-861-4957
E-mail:emf-cal@m.aist.go.jp