特別講演
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CCQM Activity on Metrology in Chemistry
R. Kaarls (国際度量衡委員会(CIPM)事務局長、同標準物質諮問委員会(CCQM)委員長)
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BIPM International Comparisons in Support of the Equivalence of Chemical
Measurement
R. Wielgosz (国際度量衡局(BIPM)化学部長)
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New Challenges for Reference Materials in the Omics Era
A. Herrero (欧州標準物質・測定研究所(IRMM)所長)
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30 Years on Reference Materials - My First-, Second-, and Third-Generation
Reference Materials -
K. Okamoto (産業技術総合研究所計量標準総合センター) |
基調講演者
| J. Betz (NIH) |
C. Chainarong (NIMT) |
K. Chiba (NMIJ) |
| S. Ellison (LGC) |
H. Emons (IRMM, REMCO) |
H. Emteborg (IRMM) |
| A. Fajgelj (IAEA) |
N. Furuta (Chuo Univ.) |
H. Haraguchi (Nagoya Univ.) |
| I. Kuselman (INPL, CITAC) |
K. Kuwa (Univ. Tsukuba) |
Y. Mitani (CENAM) |
| H. Mukai (NIES) |
S.-R. Park (KRISS) |
M. Salit (NIST) |
| L. Sander (NIST) |
H.-Y. So (KRISS) |
G. Turk (NIST) |
| S. Wise (NIST) |
S. Wood (LGC) |
A. Yasui (NFRI) |
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