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2. |
T. Saito et al. |
Polarization Properties of an Evaporated Aluminum Mirror in the VUV Region, Appl. Opt, 29, 4538-4540 (1990). |
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3. |
K. Yagi et al. |
Radiation Properties of Polarizing Undulator with Crossed and Retarded Magnetic Fields, J. Spectrosc. Soc. Jpn, 40, 281-288 (1991) (in Japanese). |
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4. |
T. Saito et al. |
Spectral Irradiance Measurements in the Visible-Ultraviolet Region using Synchrotron Radiation, Bulletin of the Electrotechnical Laboratory, 55, 1-15 (1991) (in Japanese). |
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5. |
T. Saito et al. |
A Beamline for VUV Detector Calibration, Bulletin of the Electrotechnical Laboratory, 56, 46-71 (1992) (in Japanese). |
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M. Nishi et al. |
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I. Saito |
Realization of an Instrument for Spectral Radiance and Irradiance Measurements, Bulletin of the Electrotechnical Laboratory, 57, 75-96 (1992) (in Japanese). |
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8. |
K. Yagi et al. |
Absolute spectral brightness and polarization characteristics of radiation from a polarizing undulator in the visible region, Rev. Sci Instrum. 63, 396-399 (1992). |
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9. |
T. Saito et al. |
Design and Performance of a Beamline for VUV Detector Calibration, J. Spectrosc. Soc. Jpn, 41, 385-393 (1992) (in Japanese). |
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10. |
T. Saito et al. |
Detector Calibration in the 10-60nm Spectral Range at the Electrotechnical Laboratory, J. Opt. 24, 23-30 (1993). |
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11. |
I. Saito |
Establishment of Absolute Spectral Response Standard at 633nm, J. Illum. Engng. Inst. Jpn. 78, 74-79 (1994) (in Japanese). |
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12. |
T. Saito et al. |
Application of Oblique Incidence Detector to Vacuum Ultraviolet Polarization Analyzer, Rev. Sci Instrum. 66, 1570-1572 (1995). |
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13. |
T. Saito et al. |
Detector calibration in the wavelength region 10nm to 100nm based on a windowless rare gas ionization chamber, Metrologia 32, 525-529 (1996). |
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14. |
T. Saito et al. |
Polarization characteristics of semiconductor photodiodes, Metrologia 32, 485-489 (1996). |
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15. |
M. Yuri et al. |
Polarization Characteristics of Undulator Radiation Installed in the Electron Storage Ring NIJI-II, J. Electr Spectr. Related Phenom. 80, 425-428 (1996). |
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16. |
T. Zama et al. |
Improvement of the aging characteristics of deuterium lamp, J. Electr Spectr. Related Phenom. 80, 493-496 (1996). |
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17. |
T. Saito et al. |
UV Detector Calibration Based on ESR Using Undulator Radiation, J. Electr Spectr. Related Phenom. 80, 397-400 (1996). |
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18. |
T. Saito et al. |
Polarization characteristics of Silicon Photodiodes and Its Dependence on Oxide Thickness, Rev. Sci Instrum. 67, 1-3 (1996). |
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19. |
T. Zama et al. |
Beamline for Calibration of Transfer Standard Light Source in the UV and VUV Regions, J. Synchrotron Radiation. 5, 759-761 (1998). |
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20. |
T. Zama et al. |
Aging Characteristics of Deuterium Lamp, J. Spectrosc. Soc. Jpn, 47, 129-135 (1998) (in Japanese). |
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21. |
T. Zama et al. |
Calibration of transfer standard light source in the UV and VUV regions using SR from the storage ring TERAS,J. Electr Spectr. Related Phenom. 103, 991-995 (1999). |
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H. Shitomi et al. |
Polarization Characteristics of Polarizing Undulator and its Optical System in the Electron Storage Ring NIJI-II, Bulletin of the Electrotechnical Laboratory, 63, 31-37 (1999) (in Japanese). |
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Radiation Standards and Detector Standards Utilizing Synchrotron Radiation, Bulletin of the Electrotechnical Laboratory, 64, 63-68 (2000) (in Japanese). |
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T. Saito et al. |
Difference in Silicon Photodiode Response between Collimated and Divergent Beams, Metrologia 37, 493-496 (2000). |
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26. |
T. Saito |
Metrological applications, Undulators, Wigglers and their Applications, Taylor & Francis, 421 - 434 (2002). |
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27. |
T. Saito |
Difference in the photocurrent of semiconductor photodiodes depending on the polarity of current measurement through a contribution from the photoemission current, Metrologia 40, S159-S162 (2003). |
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28. |
T. Zama et al. |
Improvement of beamline for calibration of transfer standard in the UV and VUV regions, Metrologia 40, S115-S119 (2003). |
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29. |
H. Shitomi et al. |
Development of a new integrating sphere with uniform reflectance for absolute diffuse reflectance measurements, Metrologia 40, S185-S188 (2003). |
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30. |
Y. Ichino et al. |
Improved Cryogenic Radiometry in NMIJ, Proceedings of 25th Session of the CIE, D2-18 - D2-21 (2003). |
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H. Shitomi et al. |
Establishment of an absolute diffuse reflectance scale and calibration systems at NMIJ/AIST, Proceedings of 25th Session of the CIE, D2-78 - D2-81 (2003). |
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33. |
H. Shitomi et al. |
Development of the absolute calibration facility for the total luminous flux based on goniophotomtery, Proceedings of 18th Technical Meeting on Plasma Physics of Light Sources and its Applications, 1-10 (2003) (in Japanese). |
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34. |
K. Godo |
A survey on new realization method of the candela using spectroradiometric approach, AIST Bulletin if Metrology, 2, 575-586 (2004) (in Japanese). |
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35. |
H. Shitomi et al. |
NMIJ new goniophotomter for absolute calibration of the total luminous flux, Optical Alliance, 15-3, 1-7 (2004) (in Japanese). |
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36. |
H. Shitomi et al. |
Establishment of Calibration Systems for Spectral Diffuse Reflectance Measurements Directly Traceable to the National Standard, Proceedings of Color Forum Japan 2004, 91-94 (2004) (in Japanese). |
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37. |
T. Zama et al. |
Calibration of absolute spectral radiance in UV and VUV regions by using synchrotron radiation, J. Electron Spectrosc. Relat. Phenom., 1087, 144-147 (2005). |
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38. |
T. Saito et al. |
Spectral responsivity measurements of photoconductive diamond detectors in the vacuum ultraviolet region distinguishing between internal photocurrent and photoemission current, Appl. Phys. Lett., 86, 122113-122115 (2005). |
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39. |
H. Shitomi et al. |
New Realization of Spectral Diffuse Reflectance Standard at NMIJ, Proceedings of 10th Congress of the International Colour Association (AIC Colour 05), 523-526 (2005). |
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40. |
T. Saito et al. |
Characterization of temporal response, spectral responsivity and its spatial uniformity in photoconductive diamond detectors, Diamond & Related Materials, 14, 1984-1987 (2005). |
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41. |
K. Godo et al. |
Development of a total luminous flux measurement facility for LEDs at the National Metrology Institute of Japan, Proceedings of the 9th International Conference on New Developments and Application in Optical Radiometry, 199-200 (2005). |
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T. Zama et al. |
Determining the temperature of a blackbody based on a spectral comparison with a fixed temperature blackbody, Proceedings of the 9th International Conference on New Developments and Application in Optical Radiometry, 281-282 (2005). |
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43. |
H. Shitomi et al. |
Fluorescent properties of white reference materials used in the near UV and the short wavelength range of the visible region, Proceedings of Color Forum Japan 2005, 87-90 (2005) (in Japanese). |
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44. |
T. Saito et al. |
Characterization of Photoconductive Diamond Detectors as a Candidate of FUV /VUV Transfer Standard Detectors, Metrologia, 43, S51-S55 (2006). |
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45. |
H. Shitomi et al. |
Photoluminescence from White Reference Materials for Spectral Diffuse Reflectance upon Exposure to the Radiation Shorter than 400nm, Metrologia, 43, S36-S40 (2006). |